David is a DPhil student at Keble College. He obtained his Bachelors degree in Chemical Engineering and Materials Science and Engineering at UC Berkeley. He stayed at Berkeley to complete his Masters degree in Materials Science and Engineering, where he researched the electrical resistive switching behaviour of bismuth ferrite thin film capacitors. At Oxford, his project focuses on the coherent X-ray diffraction imaging of crystal defects. He will develop new approaches for probing 3D dislocation structures on both semiconductor and metal systems.